Jeong, S., Kwak, N., Byeon, P., Chung, S., & Jung, W. (2018). Conductive nature of grain boundaries in nanocrystalline stabilized Bi<sub>2</sub>O<sub>3</sub> thin-film electrolyte. ACS Applied Materials & Interfaces. https://doi.org/10.1021/acsami.7b16875 (Original work published 2018)
SY Chung
First name:
SY
Last name:
Chung